PosiTector® 6000 NAS Anodizing Probe – on cable (0 – 625 µm)

Product Number
DEF-06110610
Interchangeable probe for PosiTector® for measuring non-conductive coatings on conductive non-ferromagnetic substrates (aluminium, copper, stainless steel, etc.). The advantage of the NAS probe is the increased accuracy of the thickness measurement of thin coatings up to 100 µm (anodizing, cataphoresis). Detail description

Interchangeable probe for PosiTector® for measuring non-conductive coatings on conductive non-ferromagnetic substrates (aluminium, copper, stainless steel, etc.). The advantage of the NAS probe is the increased accuracy of the thickness measurement of thin coatings up to 100 µm (anodizing, cataphoresis). The probe is mounted on a cable for easy handling. The package includes a calibration certificate and a set of calibration foils.

For more information about DEFELSKO® products, please visit www.defelsko.com.

Manufacturer: DeFelsko
Measuring range: 0 - 625 µm
Measurement accuracy: ± (0,5 µm + 1 %) in the range 0 - 100 µm; ± (2 µm + 3 %) in the range above 100 µm